Instrumentation [Ion Microprobe (SIMS)]

• Cameca IMS1280 ion microprobe (serial #314, installed 2009):  dual ion source, multicollector, 6-position storage chamber, electron gun
• Zeiss EVO MA15 scanning electron microscope (SEM), LaB₆ source, with detectors:  secondary electrons (inlcuding VP), backscattered electrons, Robinson cathodoluminescence (ETP Semra Pty Ltd.), Gatan ChromaCL, Oxford-Inca EDS with 80 mm² X-Max SD, Oxford-HKL EBSD
• Emitech K975X evaporative coater, Leica MED 020 sputter coater
• Dedicated clean room for grain selection, light microscopy, digital photography, 
• Mount preparation facility including slow speed saws, polishers, vacuum oven, microscopes

The IMS1280 is a state-of-the-art instrument which employs the technique of secondary ion mass spectrometry (SIMS). During SIMS, the primary ion beam (comprising Cs⁺ or O^- ions) excavates and ionizes atoms and molecules within the sample. These secondary ions are extracted into a mass analyzer to determine their mass/charge ratios and relative abundances. This instrument permits the isotope ratio analysis of minerals at a spatial resolution of ~1 - 30 microns. It is fully equipped with multiple ion and Faraday detectors, allowing analysis of a wide range of light stable isotopes (¹⁸O/¹⁶O, ¹³C/¹²C, etc.) and U-Th-Pb isotopes.  The SEM is typically used to map internal chemo-structures within minerals prior to ion probe analysis, and to document exact locations afterwards.

See the Services tab for the range of mineral-isotope systems that are currently offered.